CoEIA Researchers Publish Paper on Bypassing Advanced NXP Chip Protections
A CoEIA research team published a paper describing an innovative method to bypass the advanced protection mechanisms of NXP chips using voltage fault injection.
A research team at the Center of Excellence in Information Assurance (CoEIA), King Saud University, published a paper at a Hardware conference describing an innovative method to bypass the advanced protection mechanisms of NXP, one of the world's leading semiconductor companies.
The method relies on an advanced technique, voltage fault injection, to bypass the protections.
